Scanning Electron Microscope is a type of electron microscope which is one of the most widely used analytical tools providing highly magnified images. Using a focused beam of electrons, it generates various signals at the surface of a solid sample which reveals the details of surface morphology, chemical composition, crystalline structure and the orientation of materials constituting the sample. This high-tech microscope provides long-depth-of-field with 3D and high resolution images of the surface of the sample and near-surface.