SPECTRO has concluded a tie up with the application centre of a R&D lab at Bangalore. We can now undertake the analysis of customer samples.

The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools of modern science as it allows the study of morphology of biological and physical materials.

Electron Microscopes allow the examination objects on a very minute scale. This examination can yield the following information:

Summary of Services

Topography

The surface features of an object or "how it looks", its texture; direct relation between these features and materials properties (hardness, reflectivity...etc.)

Morphology

The shape and size of the particles making up the object; direct relation between these structures and materials properties (ductility, strength, reactivity...etc.)

Crystallographic Information

How the atoms are arranged in the object; direct relation between these arrangements and materials properties (conductivity, electrical properties, strength...etc.)

By scanning an electron probe across a specimen, high resolution morphology or topography images of a specimen can be obtained, with great depth of field at very low or very high magnifications. Characterization of fine particulate matter in terms of size, shape, and distribution as well as statistical analyses of these parameters, may be performed.

Our SEM facility in Hyderabad is a state-of-the-art ultra-high resolution Scanning Electron Microscope with a modern digital image processing system. It is a very useful instrument for studying integrated circuitry (IC) wafers, photoresist evaluation, IC research and development and IC production techniques, as well as material science, biological and industrial research.

Typical Applications

	Microscopic feature measurement
	Verification of product integrity
	Thin coating evaluations
	Evaluation and identification of microstructures on sample surfaces
	Failure analysis
	Surface contamination examination